DocumentCode :
777459
Title :
Wavelets and the study of the distant Universe
Author :
Bijaoui, Albert ; Slezak, Eric ; Rué, Frédéric ; Lega, Elena
Author_Institution :
CNRS, Nice, France
Volume :
84
Issue :
4
fYear :
1996
fDate :
4/1/1996 12:00:00 AM
Firstpage :
670
Lastpage :
679
Abstract :
The large-scale distribution of galaxies in the Universe exhibits structures at various scales, these so-called groups, clusters, and superclusters of galaxies being more or less hierarchically organized. A specific vision model is needed in order to detect, describe, and classify each component of this hierarchy. To do so, we have developed a multiscale vision model based on an unfolding into a scale space allowing us to detect structures of different sizes. A discrete wavelet transform is done by the a trous algorithm. The algorithm is implemented for astronomical images and also for lists of object positions, currently called catalogues in astronomical literature. Some applications on astrophysical data of cosmological interest are briefly described: (1) inventory procedures for galaxy counts on wide-field images, (2) processing of X-ray cluster images lending to the analyses of the total matter distribution, and (3) detection of large-scale structures from galaxy counts, From the analyses of N-body simulations we show that the vision model from the wavelet transform provides a new statistical indicator on cosmological scenarios
Keywords :
astronomical techniques; astronomy computing; clusters of galaxies; cosmology; galaxies; image processing; transforms; wavelet transforms; N-body simulations; X-ray cluster imaging; a trous algorithm; astronomical images; catalogues; discrete wavelet transform; distant Universe; galaxy counts; large-scale distribution; large-scale structure; scale space; superclusters; total matter distribution; vision model; wide-field images; Analytical models; Clustering algorithms; Discrete wavelet transforms; Image analysis; Large-scale systems; Wavelet analysis; Wavelet transforms; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/5.488706
Filename :
488706
Link To Document :
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