• DocumentCode
    777508
  • Title

    An efficient TSC 1-out-of-3 code checker

  • Author

    Paschalis, A.M. ; Efstathiou, C. ; Halatsis, C.

  • Author_Institution
    Inst. of Inf. & Telecommun., NRCPS Democritos, Attiki, Greece
  • Volume
    39
  • Issue
    3
  • fYear
    1990
  • fDate
    3/1/1990 12:00:00 AM
  • Firstpage
    407
  • Lastpage
    411
  • Abstract
    A design method for a combinational totally self-checking (TSC) 1-out-of-3 code checker is presented. This method is not only simpler and more efficient than others, but is also successful in the case where more than one 1-out-of-3 code exists in a TSC system
  • Keywords
    automatic testing; integrated logic circuits; logic design; logic testing; TSC 1-out-of-3 code checker; combinational totally self-checking; Built-in self-test; Circuit faults; Design methodology; Electrical fault detection; Face detection; Fault detection; Fault tolerance; Informatics; MOSFETs; Telecommunications;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.48873
  • Filename
    48873