DocumentCode :
777793
Title :
Radiation Damage in SiC
Author :
Babcock, Richard
Author_Institution :
Westinghouse Research Laboratories Pittsburgh, Pennsylvania
Volume :
12
Issue :
6
fYear :
1965
Firstpage :
43
Lastpage :
47
Abstract :
SiC has a band gap energy of about 2.9 ev; intrinsic SiC would be an excellent insulator at room temperature. In practice, the uncompensated room temperature resistivity of single crystal SiC rarely exceeds 100 ¿-cm. Information about radiation damage in SiC is scanty. Rates of charge carrier removal upon irradiation are similar to those found in Si. Most of the defects anneal at less than 8000C; within the operating range of some SiC devices. We have been interested principally in SiC p-n junctions, as rectifiers and as radiation detectors, and have studied their degradation in charged particle and neutron fluxes. Useful life is 1-100 times greater than can be achieved in comparable Si devices.
Keywords :
Annealing; Charge carriers; Conductivity; Insulation; P-n junctions; Photonic band gap; Radiation detectors; Rectifiers; Silicon carbide; Temperature;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1965.4323922
Filename :
4323922
Link To Document :
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