DocumentCode
777821
Title
Study of the Effects of Fast Neutrons on Silicon Controlled Rectifiers
Author
Leith, F.A. ; Blair, John
Author_Institution
Department of Electrical Engineering Massachusetts Institute of Technology Cambridge, Massaclhusetts
Volume
12
Issue
6
fYear
1965
Firstpage
64
Lastpage
68
Abstract
Medium power silicon controlled rectifiers have been exposed to a maximum integrated fastneutron flux of 4 x 1013 nvt. An increase in the current required to turn on thie controlled rectifier and an increase in the break-over voltage were observed after irradiation. The saturation voltage increased as a result of irradiation, exceeding 200 volts at an integrated fast neutron flux of 4 x 1013 nvt. These changes are attributed to a decrease of the minority carrier lifetime as reflected by a decrease in alpha.
Keywords
Charge carrier lifetime; Defense industry; Germanium; Lattices; Neutrons; Power engineering and energy; Semiconductor devices; Silicon; Thyristors; Voltage control;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1965.4323925
Filename
4323925
Link To Document