• DocumentCode
    777821
  • Title

    Study of the Effects of Fast Neutrons on Silicon Controlled Rectifiers

  • Author

    Leith, F.A. ; Blair, John

  • Author_Institution
    Department of Electrical Engineering Massachusetts Institute of Technology Cambridge, Massaclhusetts
  • Volume
    12
  • Issue
    6
  • fYear
    1965
  • Firstpage
    64
  • Lastpage
    68
  • Abstract
    Medium power silicon controlled rectifiers have been exposed to a maximum integrated fastneutron flux of 4 x 1013 nvt. An increase in the current required to turn on thie controlled rectifier and an increase in the break-over voltage were observed after irradiation. The saturation voltage increased as a result of irradiation, exceeding 200 volts at an integrated fast neutron flux of 4 x 1013 nvt. These changes are attributed to a decrease of the minority carrier lifetime as reflected by a decrease in alpha.
  • Keywords
    Charge carrier lifetime; Defense industry; Germanium; Lattices; Neutrons; Power engineering and energy; Semiconductor devices; Silicon; Thyristors; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1965.4323925
  • Filename
    4323925