DocumentCode :
777821
Title :
Study of the Effects of Fast Neutrons on Silicon Controlled Rectifiers
Author :
Leith, F.A. ; Blair, John
Author_Institution :
Department of Electrical Engineering Massachusetts Institute of Technology Cambridge, Massaclhusetts
Volume :
12
Issue :
6
fYear :
1965
Firstpage :
64
Lastpage :
68
Abstract :
Medium power silicon controlled rectifiers have been exposed to a maximum integrated fastneutron flux of 4 x 1013 nvt. An increase in the current required to turn on thie controlled rectifier and an increase in the break-over voltage were observed after irradiation. The saturation voltage increased as a result of irradiation, exceeding 200 volts at an integrated fast neutron flux of 4 x 1013 nvt. These changes are attributed to a decrease of the minority carrier lifetime as reflected by a decrease in alpha.
Keywords :
Charge carrier lifetime; Defense industry; Germanium; Lattices; Neutrons; Power engineering and energy; Semiconductor devices; Silicon; Thyristors; Voltage control;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1965.4323925
Filename :
4323925
Link To Document :
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