Title :
Some aspects of application of the two parameter SEU model
Author :
Miroshkin, V.V. ; Tverskoy, M.G.
Author_Institution :
Petersburg Nucl. Phys. Inst., Leningrad, Russia
fDate :
12/1/1995 12:00:00 AM
Abstract :
The influence of the projectile type, pion production in the nucleon-nucleon interaction inside the nucleus and direction of the beam incidence on SEU cross section for an Intel 2164A microcircuit is investigated in the framework of the two parameter model. Model parameters for devices investigated recently are reported. Optimum proton energies for determination of model parameters are proposed
Keywords :
integrated circuit modelling; integrated memory circuits; meson effects; neutron effects; proton effects; π-mesons; Intel 2164A microcircuit; SEU cross section; beam incidence direction; model parameters; neutrons; nucleon-nucleon interaction; optimum proton energies; pion production; projectile type; two parameter SEU model; Atomic layer deposition; Equations; Mesons; Nuclear physics; Particle beams; Predictive models; Production; Projectiles; Protons;
Journal_Title :
Nuclear Science, IEEE Transactions on
