DocumentCode
777985
Title
Some aspects of application of the two parameter SEU model
Author
Miroshkin, V.V. ; Tverskoy, M.G.
Author_Institution
Petersburg Nucl. Phys. Inst., Leningrad, Russia
Volume
42
Issue
6
fYear
1995
fDate
12/1/1995 12:00:00 AM
Firstpage
1809
Lastpage
1814
Abstract
The influence of the projectile type, pion production in the nucleon-nucleon interaction inside the nucleus and direction of the beam incidence on SEU cross section for an Intel 2164A microcircuit is investigated in the framework of the two parameter model. Model parameters for devices investigated recently are reported. Optimum proton energies for determination of model parameters are proposed
Keywords
integrated circuit modelling; integrated memory circuits; meson effects; neutron effects; proton effects; π-mesons; Intel 2164A microcircuit; SEU cross section; beam incidence direction; model parameters; neutrons; nucleon-nucleon interaction; optimum proton energies; pion production; projectile type; two parameter SEU model; Atomic layer deposition; Equations; Mesons; Nuclear physics; Particle beams; Predictive models; Production; Projectiles; Protons;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.488783
Filename
488783
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