Title :
Digital isolation amplifier in silicon-on-sapphire CMOS
Author :
Culurciello, E. ; Pouliquen, P.O. ; Andreou, A.G.
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT
Abstract :
The design and fabrication results of a monolithic four-channel digital isolation amplifier in a 0.5 mum silicon-on-sapphire technology is reported. The isolation device is manufactured in a single die, taking advantage of the isolation properties of the sapphire substrate. The individual isolation channels can operate in excess of 40 Mbit/s using digital phase-shift-keying modulation. Modulation of the input signal is used to increase immunity to errors at low input data rates. The device can tolerate ground bounces of 1 V/mus and isolate more than 800 V
Keywords :
CMOS digital integrated circuits; amplifiers; isolation technology; phase shift keying; silicon-on-insulator; digital phase-shift-keying modulation; monolithic four-channel digital isolation amplifier; silicon-on-sapphire CMOS; silicon-on-sapphire technology;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20070509