Title :
Novel methods for circuit worst-case tolerance analysis
Author :
Tian, Wei ; Ling, Xie-Ting ; Liu, Ruey-wen
Author_Institution :
Dept. of Electron. Eng., Fudan Univ., Shanghai, China
fDate :
4/1/1996 12:00:00 AM
Abstract :
The method, presented by E. R. Hansen (see SIAM J. Numer. Anal., vol. 29, no. 5, p. 1493-1503, 1992) for solving interval linear equations, is improved to meet the requirements of circuit worst-case tolerance analysis. Based on the solutions of interval linear equations, an analytic algorithm and an accurate algorithm are constructed. It is shown that the performances of the two algorithms are complementary: the analytic algorithm runs faster than the accurate algorithm, but has more interval expansion error. Techniques for AC tolerance analysis, time-domain tolerance analysis and DC tolerance analysis are discussed respectively. Some examples and comparisons are given
Keywords :
circuit analysis computing; error analysis; linear network analysis; nonlinear network analysis; sensitivity analysis; step response; time-domain analysis; transient response; AC tolerance analysis; DC tolerance analysis; accurate algorithm; analytic algorithm; circuit worst-case tolerance analysis; interval expansion error; interval linear equations; time-domain tolerance analysis; Algorithm design and analysis; Circuit analysis computing; Circuit synthesis; Manufacturing; Mathematics; Nonlinear equations; Performance analysis; Time domain analysis; Tolerance analysis; Vectors;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
