Circuit-level dictionaries of CMOS bridging faults

The contribution of this paper on the diagnosis (fault location) of CMOS bridging faults is threefold: First, the traditional fault dictionary (referred to as the full dictionary in this paper) is evaluated at the circuit level using a mixed-mode fault simulator. The fault set consists of randomly-generated gate input/output bridging faults. By using mixed-mode gate- and electrical-level detection methods, good diagnostic capability is achieved using only gate-level generated test sets. Second, we evaluate two reduced fault dictionaries, the pass/fail dictionary and the count dictionary. Finally, the effectiveness of I_DDQ for diagnosis is examined. The results show that I_DDQ, combined with the proposed voltage detection methods, achieves the highest diagnostic performance, with nearly complete diagnosis