Title :
The mathematics of success and failure (SPC)
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
The use of statistical process control (SPC) to improve quality is discussed. Mathematical tools and techniques for SPC are reviewed. How to decide when a change in an indicator is statistically significant is addressed. An approach to SPC in which one attempts to reduce process sensitivity to external variations rather than control these variations more tightly is discussed.<>
Keywords :
quality control; statistical process control; QC; SPC; external variations; process sensitivity; product quality improvement; statistical process control; Automobiles; Contamination; Costs; Integrated circuit manufacture; Integrated circuit technology; Manufacturing processes; Mathematics; Microelectronics; Process control; Warranties;
Journal_Title :
Circuits and Devices Magazine, IEEE
