DocumentCode
778724
Title
A study on the stability of bipolar-junction-transistor formulation in finite-difference time-domain framework
Author
Kung, Fabian ; Chuah, Hean T.
Author_Institution
Fac. of Eng., Multimedia Univ., Selangor, Malaysia
Volume
53
Issue
4
fYear
2005
fDate
4/1/2005 12:00:00 AM
Firstpage
1189
Lastpage
1196
Abstract
Recently, a new stability result has been put forward for three-dimensional finite-difference time-domain (FDTD) framework by deriving a discrete energy relation similar to the Poynting Theorem in electromagnetism. In this paper, the result is used to show how stability analysis of an FDTD model containing three-terminal nonlinear components can be performed. Here the bipolar junction transistor (BJT) is used to illustrate the idea. It is shown that instability can be due to the BJT contributing numerical energy to the system during simulation, thus causing the E- and H-field components to blow up. This paper also shows how we can prevent instability by identifying the operating region of the device where it is contributing numerical energy. By preventing the device from contributing numerical energy to the system, dynamical stability can be maintained. Formulation, which can source and sink numerical energy, is called conditionally proper. The BJT formulation in FDTD is such an example.
Keywords
bipolar transistors; finite difference time-domain analysis; stability; Courant-Friedrich-Lewy; Poynting Theorem; bipolar junction transistor; device operating region; discrete energy relation; dynamical stability; electromagnetism; finite-difference time-domain; instability prevention; numerical energy; stability analysis; Boundary conditions; Circuit stability; Dielectrics; Finite difference methods; Microwave circuits; Microwave transistors; Printed circuits; Stability analysis; Stability criteria; Time domain analysis; Courant–Friedrich–Lewy (CFL); finite-difference time domain (FDTD); lumped elements; nonlinear; stability; transistor;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2005.845744
Filename
1420747
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