Title : 
Characterization of semilumped CPW elements for Millimeter-wave filter design
         
        
            Author : 
Aryanfar, Farshid ; Sarabandi, Kamal
         
        
            Author_Institution : 
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
         
        
        
        
        
            fDate : 
4/1/2005 12:00:00 AM
         
        
        
        
            Abstract : 
In this paper, two accurate models for interdigital capacitors and shunt inductive stubs in coplanar-waveguide structures are presented and validated over the entire W-band frequency range. Using these models, a novel bandpass filter (BPF) and a miniaturized high-pass filter are designed and fabricated. By inserting interdigital capacitors in BPF resonators, an out-of-band transmission is introduced, which improves rejection level up to 17 dB over standard designs of similar filters. A high-pass filter is also designed, using semilumped-element models in order to miniaturize the filter structure. It is shown that a fifth-order high-pass filter can be built with a maximum dimension of less than λg/3. Great agreement between simulated and measured responses of these filters is demonstrated.
         
        
            Keywords : 
band-pass filters; coplanar waveguides; high-pass filters; BPF resonators; VF band; bandpass filter; coplanar waveguide structures; filter structure; high-pass filter; interdigital capacitors; millimeter wave filter design; out-of-band transmission; semilumped CPW elements; shunt inductive stubs; Band pass filters; Calibration; Capacitors; Coplanar waveguides; Fabrication; Microwave frequencies; Millimeter wave measurements; Resonator filters; Semiconductor device modeling; Waveguide discontinuities; Bandpass; coplanar waveguide (CPW); filter; high-pass; interdigital capacitor; millimeter wave; semilumped;
         
        
        
            Journal_Title : 
Microwave Theory and Techniques, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TMTT.2005.845748