DocumentCode
778896
Title
The failure of Bayes system reliability inference based on data with multi-level applicability
Author
Philipson, Lloyd L.
Author_Institution
ACTA Inc., Torrance, CA, USA
Volume
45
Issue
1
fYear
1996
fDate
3/1/1996 12:00:00 AM
Firstpage
66
Lastpage
68
Abstract
When test or operation-experience data are used that apply at once to two or more system-levels, Bayes reliability inferences at different levels generally give inconsistent results. This inconsistency, quite counter-intuitive when it is first recognized, is particularly important in major analyses of occurrence rates of failures and consequent hazards in space and missile launches. It arises as the lack of perfect aggregation in other applications, as well. Others might consider this inconsistency merely a modeling error, and then attempt, with negligible success, to find means for ameliorating it. The author believes it represents a fundamental breakdown in the usual Bayes methodology in the circumstances noted. A basic restructuring of the Bayes procedure is required (e.g. by exchanging the roles of engineering and experience data). The author gives an illustrative example
Keywords
Bayes methods; aerospace; failure analysis; missiles; reliability theory; Bayes procedure restructuring; Bayes system reliability inference failure; failure rate occurrence analysis; missile launches; multi-level applicability; operation-experience data; space launches; test data; Aerospace engineering; Electric breakdown; Failure analysis; Hazards; Information analysis; Missiles; Reliability engineering; System testing; Uncertainty; Vehicles;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.488918
Filename
488918
Link To Document