Title :
Self-field and geometry effects in transport current applications of multifilamentary Bi-2223/Ag conductors
Author :
Stavrev, Svetlomir ; Dutoit, Bertrand ; Grilli, Francesco
Author_Institution :
Lab. of Nonlinear Syst., Swiss Fed. Inst. of Technol., Lausanne, Switzerland
Abstract :
This paper describes quantitatively the influence of the self-field and the cross-sectional geometry on the effective critical current and the ac losses in transport current applications of nontwisted multifilamentary Bi-2223/Ag conductors. The results are obtained with finite-element method simulations. The numerical implementation includes an anisotropic model for the dependence of the critical current density Jc and the power index n on the local parallel and perpendicular magnetic field components. The relation is given between the intrinsic critical current density and the effective critical current for different multifilamentary conductors. Shown are examples of the current and magnetic flux density distributions in order to demonstrate their effect on the ac losses in self-field.
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); critical currents; finite element analysis; high-temperature superconductors; losses; multifilamentary superconductors; silver; strontium compounds; Bi2Sr2Ca2Cu3Ox-Ag; ac losses; anisotropic model; critical current density; cross-sectional geometry; effective critical current; finite-element method simulations; geometry effects; intrinsic critical current density; local parallel magnetic field components; local perpendicular magnetic field components; magnetic flux density distributions; multifilamentary Bi-2223/Ag conductors; numerical implementation; power index; self-field effects; transport current applications; Conductors; Critical current; Critical current density; Current measurement; Density measurement; Finite element methods; Geometry; High temperature superconductors; Magnetic field measurement; Wires;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.816203