DocumentCode :
779391
Title :
On random testing for combinational circuits with a high measure of confidence
Author :
Das, Sunil R. ; Jone, Wen-Ben
Author_Institution :
Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
Volume :
22
Issue :
4
fYear :
1992
Firstpage :
748
Lastpage :
754
Abstract :
One of the most important problems in random testing is the measurement of test confidence after a sequence of test vectors has been applied. Sequential statistical analysis is employed to determine the random test confidence. According to the analysis, the random test confidence depends on the detection probability of the circuit under test, the random test length, and the manufacturing yield. A detection procedure driven by a test quality indicator without presumed random test length is proposed based on the results of the sequential statistical analysis. Performance evaluation and simulation results demonstrate that the sequential statistical analysis reflects a better random test confidence than conventional approaches. This difference is due to the fact that conventional test confidence measures do not take the manufacturing yield into account
Keywords :
combinatorial circuits; logic testing; probability; statistical analysis; combinational circuits; detection probability; manufacturing yield; random testing; sequential statistical analysis; test confidence; test quality indicator; Analytical models; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Manufacturing; Pattern recognition; Probability; Sequential analysis; Statistical analysis;
fLanguage :
English
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9472
Type :
jour
DOI :
10.1109/21.156587
Filename :
156587
Link To Document :
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