DocumentCode :
77942
Title :
D-Q Current Signature-Based Faulted Phase Localization for SM-PMAC Machine Drives
Author :
Kuruppu, Sandun S. ; Kulatunga, N. Athula
Author_Institution :
Purdue Univ., West Lafayette, IN, USA
Volume :
62
Issue :
1
fYear :
2015
fDate :
Jan. 2015
Firstpage :
113
Lastpage :
121
Abstract :
Fault diagnostic algorithms in motor drives prevent damage to the motor, drive, and overall system by providing an additional level of safety. A single phase open (SPO) fault in a field-oriented controlled drive is one of the perilous faults that require immediate detection due to resulting oscillatory electromagnetic torque. SPO fault results in a significantly high electromagnetic torque ripple. The rapid mechanical vibration caused by the torque ripple exposes the system to failure modes. The single open phase fault detection algorithm proposed in this paper enables the rapid detection of the fault, with minimal system resources, compared to existing methods. Proof of accurate fault detection capability for a wide speed range is presented through simulation and experimental results. The proposed method is also capable of localizing the faulted phase via a novel time domain rotor reference frame current signature analysis.
Keywords :
failure analysis; fault diagnosis; logic testing; permanent magnet motors; rotors; signal processing; surface mount technology; synchronous motor drives; time-domain analysis; torque; D-Q current signature-based faulted phase localization; SM-PMAC machine drive; SPO fault diagnostic algorithm; electromagnetic torque ripple; field-oriented controlled drive; mechanical vibration; motor damage; motor drive safety; motor failure mode; open phase fault detection algorithm; perilous fault detection; single phase open fault; surface-mount permanent magnet synchronous machine; time domain rotor reference frame current signature analysis; torque ripple; Algorithm design and analysis; Circuit faults; Electromagnetics; Fault detection; Mathematical model; Rotors; Torque; AC motor drives; fault detection; fault diagnosis; open circuit fault;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2014.2334652
Filename :
6847678
Link To Document :
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