Title :
Fluctuations of Energy Loss in Semiconductor Detectors
Author :
Maccabee, Howard D. ; Raju, Mudundi R. ; Tobias, Cornelius A.
Author_Institution :
Lawrence Radiation Laboratory University of California Berkeley, California
fDate :
6/1/1966 12:00:00 AM
Abstract :
Significant fluctuations and broadening of the energy-loss spectrum are expected in certain cases of passage of charged particles through "thin" detectors. Experimental measurements of this phenomenon (by use of lithium-drifted silicon detectors) are in good agreement with the rigorous theory of Vavilov, as tabulated by Seltzer and Berger.
Keywords :
Atomic measurements; Electrons; Energy exchange; Energy loss; Energy measurement; Fluctuations; Radiation detectors; Semiconductor radiation detectors; Shape measurement; Silicon;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1966.4324096
