• DocumentCode
    779734
  • Title

    Unified model for collector charge in heterojunction bipolar transistors

  • Author

    Rudolph, Matthias ; Doerner, Ralf ; Beilenhoff, Klaus ; Heymann, Peter

  • Author_Institution
    Ferdinand-Braun-Inst. fur Hochstfrequenztechnik, Berlin, Germany
  • Volume
    50
  • Issue
    7
  • fYear
    2002
  • fDate
    7/1/2002 12:00:00 AM
  • Firstpage
    1747
  • Lastpage
    1751
  • Abstract
    The base-collector capacitance and the collector transit-time in GaAs-based heterojunction bipolar transistors depend not only on base-collector voltage, but also on collector current. This has to be taken into account in a large-signal model. However, since collector transit-time and capacitance are both caused by the charge stored in the collector space-charge region, it is not possible to model them independently of each other. This paper investigates the interrelation between collector capacitance and transit-time due to transcapacitance effects, and presents an analytical unified description for both quantities, that is derived from measurement-extracted small-signal equivalent circuits. The model is verified by comparison of simulation and measurement data
  • Keywords
    III-V semiconductors; capacitance; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; semiconductor device measurement; semiconductor device models; GaAs-based heterojunction bipolar transistors; base-collector capacitance; base-collector voltage; collector capacitance; collector capacitance/transit-time interrelation; collector current; collector space-charge region; collector transit-time; heterojunction bipolar transistors; large-signal model; measurement data; measurement-extracted small-signal equivalent circuits; model verification; simulation; stored charge; transcapacitance effects; unified collector charge model; Capacitance measurement; Circuit simulation; Current density; Equivalent circuits; Helium; Heterojunction bipolar transistors; Linearity; Radio frequency; Semiconductor device modeling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2002.800425
  • Filename
    1017639