Title :
Guest Editor´s Introduction: Reliability-Aware Microarchitecture
Author :
Adve, Sarita V. ; Sanda, Pia
Author_Institution :
University of Illinois at Urbana-Champaign
Abstract :
This special issue of IEEE Micro addresses the trends toward reliability-aware microarchitecture, their system-level implications, and some innovative ideas on how to build systems in the face of those challenges.
Keywords :
CMOS scaling; Reliability-aware microarchitecture; reliability management; soft errors; CMOS logic circuits; Costs; Degradation; Hardware; Logic devices; Microarchitecture; Operating systems; Redundancy; Temperature; Timing; CMOS scaling; Reliability-aware microarchitecture; reliability management; soft errors;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.2005.112
