Title :
An experimental study of soft errors in microprocessors
Author :
Saggese, Giacinto P. ; Wang, Nicholas J. ; Kalbarczyk, Zbigniew T. ; Patel, Sanjay J. ; Iyer, Ravishankar K.
Author_Institution :
Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
Abstract :
The issue of soft errors is an important emerging concern in the design and implementation of future microprocessors. The authors examine the impact of soft errors on two different microarchitectures: a DLX processor for embedded applications and a high-performance alpha processor. The results contrast impact of soft errors on combinational and sequential logic, identify the most vulnerable units, and assess soft error impact on the application.
Keywords :
computer architecture; embedded systems; error detection; logic design; microprocessor chips; DLX processor; combinational logic; embedded applications; high-performance alpha processor; microarchitectures; microprocessors; sequential logic; soft errors; Application software; Computer crashes; Computer errors; Electromagnetic interference; Flip-flops; Logic devices; Microprocessors; Pins; Registers; Voltage; Assessment and Protection Techniques; Fault Injection; Microprocessor Architecture; Soft error sensitivity; Soft errors;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.2005.104
