DocumentCode
780072
Title
Mapping a diffraction field close to an obstacle
Author
Nye, J.F. ; Liang, W. ; Hygate, G.
Author_Institution
Dept. of Phys., Bristol Univ., UK
Volume
37
Issue
2
fYear
1995
fDate
5/1/1995 12:00:00 AM
Firstpage
288
Lastpage
292
Abstract
Demonstrates the effectiveness of the optically modulated scatterer technique as a probe for EMC measurements. As a practical test, the authors have measured the spatial distribution of the known microwave field caused by diffraction by a half-plane. The field was produced by directing linearly polarized 10 GHz radiation from a horn antenna on to the edge of a plane conducting sheet with an angle of incidence of approximately 45° and with the electric field parallel to the edge. The amplitude and phase of the electric field were measured on both sides of the sheet at distances from the edge down to a small fraction of a wavelength, and the results were compared with a modified form of Sommerfeld´s classical theory in which the source is a line current parallel to the edge. The spatial phase pattern matched well everywhere; in regions of small phase gradient the phase agrees to within 10°. The amplitude pattern was reproduced with an accuracy of about 5%
Keywords
electric fields; electromagnetic compatibility; electromagnetic wave diffraction; microwave measurement; 10 GHz; EMC measurements; SHF; Sommerfeld´s classical theory; amplitude; diffraction field; electric field; incidence; line current; linearly polarized 10 GHz radiation; microwave field; obstacle; optically modulated scatterer technique; plane conducting sheet; spatial distribution; spatial phase pattern; Antenna measurements; Electromagnetic compatibility; Horn antennas; Microwave measurements; Optical diffraction; Optical modulation; Optical polarization; Optical scattering; Probes; Testing;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/15.385896
Filename
385896
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