• DocumentCode
    780072
  • Title

    Mapping a diffraction field close to an obstacle

  • Author

    Nye, J.F. ; Liang, W. ; Hygate, G.

  • Author_Institution
    Dept. of Phys., Bristol Univ., UK
  • Volume
    37
  • Issue
    2
  • fYear
    1995
  • fDate
    5/1/1995 12:00:00 AM
  • Firstpage
    288
  • Lastpage
    292
  • Abstract
    Demonstrates the effectiveness of the optically modulated scatterer technique as a probe for EMC measurements. As a practical test, the authors have measured the spatial distribution of the known microwave field caused by diffraction by a half-plane. The field was produced by directing linearly polarized 10 GHz radiation from a horn antenna on to the edge of a plane conducting sheet with an angle of incidence of approximately 45° and with the electric field parallel to the edge. The amplitude and phase of the electric field were measured on both sides of the sheet at distances from the edge down to a small fraction of a wavelength, and the results were compared with a modified form of Sommerfeld´s classical theory in which the source is a line current parallel to the edge. The spatial phase pattern matched well everywhere; in regions of small phase gradient the phase agrees to within 10°. The amplitude pattern was reproduced with an accuracy of about 5%
  • Keywords
    electric fields; electromagnetic compatibility; electromagnetic wave diffraction; microwave measurement; 10 GHz; EMC measurements; SHF; Sommerfeld´s classical theory; amplitude; diffraction field; electric field; incidence; line current; linearly polarized 10 GHz radiation; microwave field; obstacle; optically modulated scatterer technique; plane conducting sheet; spatial distribution; spatial phase pattern; Antenna measurements; Electromagnetic compatibility; Horn antennas; Microwave measurements; Optical diffraction; Optical modulation; Optical polarization; Optical scattering; Probes; Testing;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.385896
  • Filename
    385896