Measured distortion of the output-waveform of an integrated OPAMP due to substrate noise

Author

Catrysse, Johan

Author_Institution

EMC Lab., Katholieke Ind. Hogeschool, Oostende, Belgium

Volume

37

Issue

2

fYear

1995

fDate

5/1/1995 12:00:00 AM

Firstpage

310

Lastpage

312

Abstract

In mixed signal applications, interference problems due to ground noise and substrate noise are well known. The problem is becoming very timely in applications, such as the logical control of analog amplifiers in monolithic technologies, because of two reasons: the use of higher clock frequencies and high speed logic circuitry, and the technologies moving into 1 μ and submicron regions. In this paper, some measured results are reported on the effects caused by logical control pulses on the behavior of OPAMP´s. The results were gained from sophisticated experiments, and can serve as a basis for further theoretical investigations

Keywords

analogue integrated circuits; electromagnetic interference; integrated circuit noise; integrated circuit testing; mixed analogue-digital integrated circuits; operational amplifiers; analog amplifiers; clock frequencies; ground noise; high speed logic circuitry; integrated OPAMP; interference problems; logical control; logical control pulses; mixed signal applications; monolytic technologies; output-waveform distortion; substrate noise; Circuits; Demodulation; Differential amplifiers; Distortion measurement; Frequency; Noise measurement; Operational amplifiers; Radiofrequency interference; Statistics; Voltage;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/15.385902

Filename

385902