DocumentCode
780173
Title
Measured crosstalk on chips using specially designed components
Author
Catrysse, Johan ; Sinnaeve, A. ; Vandecasteele, G.
Author_Institution
EMC Lab., Katholieke Ind. Hogeschool, Oostende, Belgium
Volume
37
Issue
2
fYear
1995
fDate
5/1/1995 12:00:00 AM
Firstpage
313
Lastpage
315
Abstract
In mixed signal applications, interference problems due to crosstalk are well known. These problems have also been reported at the VLSI-IC level. A specially designed chip was used for performing crosstalk measurements at the chip level. Some of the observed effects are reported. The results were gained from sophisticated experiments and can serve as a basis for further theoretical investigations
Keywords
CMOS integrated circuits; VLSI; crosstalk; electric noise measurement; integrated circuit measurement; integrated circuit noise; mixed analogue-digital integrated circuits; 3 mum; VLSI-IC level; crosstalk; interference problems; mixed signal applications; Bonding; CMOS technology; Crosstalk; Interference; Packaging; Performance evaluation; Semiconductor device measurement; Signal design; Silicon; Testing;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/15.385903
Filename
385903
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