Title :
Measured crosstalk on chips using specially designed components
Author :
Catrysse, Johan ; Sinnaeve, A. ; Vandecasteele, G.
Author_Institution :
EMC Lab., Katholieke Ind. Hogeschool, Oostende, Belgium
fDate :
5/1/1995 12:00:00 AM
Abstract :
In mixed signal applications, interference problems due to crosstalk are well known. These problems have also been reported at the VLSI-IC level. A specially designed chip was used for performing crosstalk measurements at the chip level. Some of the observed effects are reported. The results were gained from sophisticated experiments and can serve as a basis for further theoretical investigations
Keywords :
CMOS integrated circuits; VLSI; crosstalk; electric noise measurement; integrated circuit measurement; integrated circuit noise; mixed analogue-digital integrated circuits; 3 mum; VLSI-IC level; crosstalk; interference problems; mixed signal applications; Bonding; CMOS technology; Crosstalk; Interference; Packaging; Performance evaluation; Semiconductor device measurement; Signal design; Silicon; Testing;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on