Title :
Propagation loss of bent light-guiding metal line loaded on embedded dielectric core
Author :
Yamazaki, T. ; Aono, H. ; Yamauchi, J. ; Shibayama, J. ; Nakano, H.
Author_Institution :
Fac. of Eng., Hosei Univ., Tokyo, Japan
fDate :
3/17/2005 12:00:00 AM
Abstract :
The beam-propagation method is applied to the analysis of a bent light-guiding metal (Ag) line loaded on an embedded dielectric core. For a bending radius of down to ≅200 μm, the propagation loss is found to be smaller than that of a straight metal line at a wavelength of 1.55 μm.
Keywords :
integrated optics; optical communication equipment; optical losses; optical waveguides; silver; waveguide discontinuities; 1.55 micron; Ag; beam-propagation method; bent light-guiding metal line; embedded dielectric core; integrated optics; propagation loss;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20057760
