DocumentCode :
780268
Title :
Development of integral passive components for multilayer organic MCMs at millimeter wave frequencies
Author :
Pham, Anh-Vu H. ; Krishnamurthy, Vikram ; Bates, D. ; Marcinkewicz, W. ; Schmanski, B. ; Saia, R. ; Sprinceanu, L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
Volume :
25
Issue :
1
fYear :
2002
fDate :
2/1/2002 12:00:00 AM
Firstpage :
98
Lastpage :
101
Abstract :
We present the design and development of Ta2N thin-film resistors for the multilayer organic multichip module (MCM) at microwave and millimeter wave frequencies. The Ta2N thin-film resistors are integrated directly onto multilayer Kapton films and achieve a resistivity of 12.5 Ω/sq. to 25 Ω/sq. Several Ta2N thin-film resistor structures have been fabricated and electrically characterized up to 50 GHz to develop design rules for this process. For the first time, an ultra-wide band terminator has been developed and integrated on Kapton flex using Ta2N thin-film resistors. The measured results of this circuit demonstrate a return loss of less than 20-dB over a 50-GHz bandwidth
Keywords :
integrated circuit packaging; millimetre wave integrated circuits; molecular electronics; multichip modules; tantalum compounds; thin film resistors; 20 dB; 50 GHz; Kapton flex; Ta2N; Ta2N thin-film resistors; design rules; direct integration; integral passive components; millimeter wave frequencies; multilayer Kapton films; multilayer organic multichip module; resistivity; return loss; ultra-wide band terminator; Bandwidth; Conductivity; Frequency; Integrated circuit measurements; Loss measurement; Multichip modules; Nonhomogeneous media; Resistors; Thin film circuits; Transistors;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2002.1017691
Filename :
1017691
Link To Document :
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