Title :
320 Gbit/s error-free demultiplexing using ultrafast optical gate monolithically integrating a photodiode and electroabsorption modulator
Author :
Kodama, S. ; Yoshimatsu, T. ; Ito, H.
Author_Institution :
NTT Photonics Labs., NTT Corp., Atsugi, Japan
Abstract :
A 320 Gbit/s error-free demultiplexing operation with a receiver sensitivity of -18 dBm using a monolithic optical gate integrating a uni-travelling-carrier photodiode and a travelling-wave electroabsorption modulator has been demonstrated. High on/off ratios of 14 dB for adjacent channels and 28 dB for the others have also been achieved.
Keywords :
demultiplexing equipment; electro-optical modulation; electroabsorption; integrated optoelectronics; optical communication equipment; photodiodes; 320 Gbit/s; electroabsorption modulator; error-free demultiplexing; monolithic optical gate; travelling-wave EA modulator; ultrafast optical gate; uni-travelling-carrier photodiode;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030813
