• DocumentCode
    780526
  • Title

    Aperture jitter in BPSK systems

  • Author

    Dempster, A.

  • Author_Institution
    Sch. of Surveying & Spatial Inf. Syst., Univ. of New South Wales, Sydney, NSW, Australia
  • Volume
    41
  • Issue
    6
  • fYear
    2005
  • fDate
    3/17/2005 12:00:00 AM
  • Firstpage
    371
  • Lastpage
    373
  • Abstract
    Aperture jitter effects in sampled systems have usually been modelled as additive noise, based on a sinusoidal input signal. However, in BPSK systems, large errors can occur if the jittered sample crosses a data bit boundary. This case is analysed here and found to be significant for cases of small jitter variance.
  • Keywords
    jitter; phase shift keying; signal sampling; BPSK systems; additive noise; aperture jitter effects; data bit boundary; jitter variance; sampled systems; sinusoidal input signal;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20057416
  • Filename
    1421207
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=780526