DocumentCode :
780587
Title :
Identification of Wiener-Hammerstein models using linear interpolation in the frequency domain (LIFRED)
Author :
Tan, Ai Hui ; Godfrey, Keith
Author_Institution :
Div. of Electr. & Electron. Eng., Warwick Univ., Coventry, UK
Volume :
51
Issue :
3
fYear :
2002
fDate :
6/1/2002 12:00:00 AM
Firstpage :
509
Lastpage :
521
Abstract :
A new method to identify the linear subsystems of a Wiener-Hammerstein model through the measurement of the second-order Volterra kernel is proposed. This technique makes use of the symmetry properties of the Volterra kernel and assumes that the frequency response gain and phase between estimated points can be reasonably well approximated by a straight line. The signal applied for the identification is a multisine with properties of no interharmonic distortion. Several advantages of the proposed method over existing ones are discussed, and two simulation examples are presented to illustrate the applicability of the technique. The method is also shown to be robust to noise and distortion in the input signal
Keywords :
frequency response; frequency-domain analysis; identification; interpolation; linear systems; nonlinear systems; transfer functions; Wiener-Hammerstein model; frequency domain identification; frequency response gain; linear interpolation; linear subsystems; second-order Volterra kernel; Distortion; Frequency domain analysis; Frequency estimation; Frequency measurement; Interpolation; Kernel; Linear systems; Noise robustness; Nonlinear systems; Signal processing;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2002.1017722
Filename :
1017722
Link To Document :
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