Title :
SEU fault tolerance in artificial neural networks
Author :
Velazco, R. ; Assoum, A. ; Radi, N.E. ; Ecoffet, R. ; Botey, X.
Author_Institution :
Lab. de Genie Inf., LGI/IMAG, Grenoble, France
fDate :
12/1/1995 12:00:00 AM
Abstract :
In this paper we investigate the robustness of Artificial Neural Networks when encountering transient modification of information bits related to the network operation. These kinds of faults are likely to occur as a consequence of interaction with radiation. Results of tests performed to evaluate the fault tolerance properties of two different digital neural circuits are presented
Keywords :
fault tolerant computing; neural chips; radiation effects; SEU fault tolerance; artificial neural networks; digital neural circuit; information bits; radiation interaction; robustness; transient modification; Application software; Artificial neural networks; Circuit faults; Circuit testing; Fault tolerance; Intelligent networks; Neurons; Performance evaluation; Single event upset; Very large scale integration;
Journal_Title :
Nuclear Science, IEEE Transactions on
