• DocumentCode
    780627
  • Title

    Analog fault diagnosis of actual circuits using neural networks

  • Author

    Aminian, Farzan ; Aminian, Mehran ; Collins, H.W., Jr.

  • Author_Institution
    Dept. Eng., St. Mary´´s Univ., San Antonio, TX, USA
  • Volume
    51
  • Issue
    3
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    544
  • Lastpage
    550
  • Abstract
    We have developed a neural-network based analog fault diagnostic system for actual circuits. Our system uses a data acquisition board to excite a circuit with an impulse and sample its output to collect training data for the neural network. The collected data is preprocessed by wavelet decomposition, normalization, and principal component analysis (PCA) to generate optimal features for training the neural network. This ensures a simple architecture for the neural network and minimizes the size of the training set required for its proper training. Our studies indicate that features extracted from actual circuits lie closer to each other and exhibit more overlap across fault classes compared to SPICE simulations. This implies that the neural network architecture which can most reliably perform fault diagnosis of actual circuits is one whose outputs estimate the probabilities that input features belong to different fault classes. Our work also shows that SPICE simulations can be used to select appropriate features for training the neural network. Reliable diagnosis of faults in an actual circuit, however, requires training data from the circuit itself. Our fault diagnostic system, trained and tested using data obtained from real sample circuits, achieves 95% accuracy in classifying faulty components
  • Keywords
    analogue circuits; circuit analysis computing; fault diagnosis; feedforward neural nets; neural net architecture; principal component analysis; probability; wavelet transforms; PCA; analog circuits; analog fault diagnostic system; data acquisition board; electronic circuits; neural network architecture; neural network based system; neural network training data; normalization; principal component analysis; probabilities; wavelet decomposition; Circuit faults; Circuit simulation; Circuit testing; Data acquisition; Fault diagnosis; Neural networks; Principal component analysis; SPICE; Training data; Wavelet analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2002.1017726
  • Filename
    1017726