Title :
Characterization and qualification of a neutron irradiation environment for neutron hardness assurance testing of electronic devices
Author :
Bennion, J.S. ; Sandquist, G.M. ; Kelly, J.G. ; Griffin, P.J. ; Sheehan, P.S. ; Saxey, B.L.
Author_Institution :
Coll. of Eng., Idaho State Univ., Pocatello, ID, USA
fDate :
12/1/1995 12:00:00 AM
Abstract :
Diagnostic experiments have been performed to characterize and validate a neutron irradiation environment for use as a calibrated neutron source for neutron hardness assurance testing. Facility qualification for a TRIGA nuclear reactor was achieved by comparing the neutron-induced displacement damage in divided-lots of Si-based electronic components irradiated to the same 1-MeV equivalent fluence at the candidate environment and at a qualified fast burst reactor facility
Keywords :
neutron effects; neutron sources; radiation hardening (electronics); semiconductor device testing; 1 MeV; Si; TRIGA nuclear reactor; calibrated neutron source; displacement damage; electronic devices; facility qualification; fast burst reactor; neutron hardness assurance testing; neutron irradiation; Aluminum; Contracts; Electronic components; Electronic equipment testing; Fuels; Inductors; Laboratories; Neutrons; Nuclear electronics; Qualifications;
Journal_Title :
Nuclear Science, IEEE Transactions on