DocumentCode
780751
Title
Implications of single event effect characterization of hybrid DC-DC converters and a solid state power controller
Author
LaBel, Kenneth A. ; Barry, Richard K. ; Castell, Karen ; Kim, Hak S. ; Seidleck, Christina M.
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Volume
42
Issue
6
fYear
1995
fDate
12/1/1995 12:00:00 AM
Firstpage
1957
Lastpage
1963
Abstract
As part of National Aeronautics and Space Administration (NASA)/Goddard Space Flight Center´s (GSFC) efforts in supporting spaceflight qualification for multiple programs, single event effect (SEE) characterization of various DC-DC power converters as well as a solid-state power controller (SSPC) was undertaken. The implications of these test results are further discussed
Keywords
DC-DC power convertors; hybrid integrated circuits; integrated circuit reliability; integrated circuit testing; ion beam effects; power integrated circuits; space vehicle electronics; Goddard Space Flight Center; NASA; hybrid DC-DC converters; single event effect; single event effect characterization; solid state power controller; spaceflight qualification; DC-DC power converters; MOSFETs; NASA; Pulse width modulation; Pulse width modulation converters; Single event upset; Solid state circuits; Space vehicles; Testing; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.489240
Filename
489240
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