Title :
Implications of single event effect characterization of hybrid DC-DC converters and a solid state power controller
Author :
LaBel, Kenneth A. ; Barry, Richard K. ; Castell, Karen ; Kim, Hak S. ; Seidleck, Christina M.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fDate :
12/1/1995 12:00:00 AM
Abstract :
As part of National Aeronautics and Space Administration (NASA)/Goddard Space Flight Center´s (GSFC) efforts in supporting spaceflight qualification for multiple programs, single event effect (SEE) characterization of various DC-DC power converters as well as a solid-state power controller (SSPC) was undertaken. The implications of these test results are further discussed
Keywords :
DC-DC power convertors; hybrid integrated circuits; integrated circuit reliability; integrated circuit testing; ion beam effects; power integrated circuits; space vehicle electronics; Goddard Space Flight Center; NASA; hybrid DC-DC converters; single event effect; single event effect characterization; solid state power controller; spaceflight qualification; DC-DC power converters; MOSFETs; NASA; Pulse width modulation; Pulse width modulation converters; Single event upset; Solid state circuits; Space vehicles; Testing; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
