Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX

Author

Adolphsen, John ; Barth, Janet L. ; Stassinopoulos, E.G. ; Gruner, Timothy ; Wennersten, Miriam ; LaBel, Kenneth A. ; Seidleck, Christina M.

Author_Institution

UNISYS, Lanham, MD, USA

Volume

42

Issue

6

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

1964

Lastpage

1974

Abstract

This paper presents the results from the CRUX experiment on the Air Force APEX satellite. The experiment monitors single event upsets on screened commercial 256 Kbit and 1 Mbit SRAMs. It is shown that trapped protons dominate the single event upset rates, as evidenced by correlation with measured proton flux peaks and with flux contours calculated with the AP8 model. Pitfalls of using generic ground test data are made clearly evident

Keywords

SRAM chips; aerospace testing; cosmic ray interactions; integrated circuit measurement; integrated circuit modelling; integrated circuit testing; proton effects; space vehicle electronics; 1 Mbit; 256 Kbit; AP8 model; Air Force APEX satellite; CRUX experiment; SRAMs; cosmic ray upset experiments; flux contours; generic ground test data; proton flux peaks; screened commercial ICs; single event upset rates; trapped protons; Hardware; Instruments; MOS devices; Particle measurements; Protons; Random access memory; Satellites; Single event upset; Space vehicles; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.489241

Filename

489241