Title :
An overview of test synthesis tools
Author :
Aitken, Robert C.
Author_Institution :
Hewlett-Packard Co., USA
Abstract :
The two types of tools now commercially available implement the basic elements of first synthesis differently. Selecting among various gate- and RT-level tools requires a careful evaluation considering issues like desired circuit quality, methodology circuit area, and integration
Keywords :
built-in self test; design for testability; logic testing; RT-level tools; circuit quality; gate-level tools; methodology circuit area; test synthesis tools; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Design for testability; Design methodology; Logic circuits; Logic design; Logic testing; Time to market;
Journal_Title :
Design & Test of Computers, IEEE
