SEE rate calculations using the effective flux approach and a generalized figure of merit approximation

Author

Petersen, E.L.

Author_Institution

9502 Babson Ct., Fairfax, VA, USA

Volume

42

Issue

6

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

1995

Lastpage

2003

Abstract

This paper explains the inconsistencies reported between effective flux calculations and integral rectangular parallelepiped calculations. The two types of calculation yield consistent results when the effective flux calculation is performed allowing for the appropriate geometry. A set of generic heavy ion cross section curves is introduced so that upset rate calculations can be compared as a function of device area and threshold. The figure of merit approximation is generalized so that it can be used for any orbit

Keywords

integrated circuit modelling; integrated circuit testing; ion beam effects; ion beams; space vehicle electronics; SEE rate calculations; device area; effective flux approach; generalized figure of merit approximation; generic heavy ion cross section curves; integral rectangular parallelepiped calculations; single event effect; space environment; threshold; upset rate calculations; Area measurement; Equations; Extraterrestrial measurements; Geometry; Magneto electrical resistivity imaging technique; Orbital calculations; Shape;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.489245

Filename

489245