DocumentCode :
78084
Title :
Investigating the Effect of Piezoelectric Polarization on GaN-Based LEDs With Different Quantum Barrier Thickness
Author :
Wang, C.K. ; Chiang, T.H. ; Chen, Kenneth Y. ; Chiou, Y.Z. ; Lin, T.K. ; Chang, S.P. ; Chang, S.J.
Author_Institution :
Dept. of Electron. Eng., Southern Taiwan Univ. of Sci. & Technol., Tainan, Taiwan
Volume :
9
Issue :
4
fYear :
2013
fDate :
Apr-13
Firstpage :
206
Lastpage :
211
Abstract :
The effect of temperature-dependent electroluminescence (EL) on nitride-based light-emitting diodes (LEDs) with different thicknesses of quantum barrier are studied and demonstrated. It was found that quantum confined stark effect (QCSE) of 6-nm thick barrier was more slightly than that of 9- and 12-nm thick barrier. The results indicated that the polarization field is independent of ambient temperature due to no clearly change of blue-shift value. The results also pointed out that the polarization field within the active region of 12-nm thick barrier was stronger than the others due to larger variation of the wavelength transition position (i.e. blue-shift change to red-shift) from 300 to 350 K, and thus it needed more injection carriers to complete the screening of QCSE. In this study, we reported a simple method to provide useful comparison of electrostatic fields within active region in nitride-based LEDs, specifically for structures consisting of identical active regions with different barrier thicknesses.
Keywords :
III-V semiconductors; LED displays; electrostatics; gallium compounds; light polarisation; quantum confined Stark effect; wide band gap semiconductors; EL; GaN; LED; QCSE; blue-shift value; electrostatic field; injection carrier; light-emitting diode; piezoelectric polarization effect; quantum barrier thickness; quantum confined stark effect; red-shift value; size 12 nm; size 6 nm; size 9 nm; temperature-dependent electroluminescence; wavelength transition position; Gallium nitride; Light emitting diodes; Piezoelectric polarization; Quantum well devices; Semiconductor device measurement; Solid state lighting; Temperature measurement; Nitride-based light-emitting diodes (LEDs); polarization field; quantum barrier; quantum confined stark effect (QCSE); temperature-dependent electroluminescence (EL);
fLanguage :
English
Journal_Title :
Display Technology, Journal of
Publisher :
ieee
ISSN :
1551-319X
Type :
jour
DOI :
10.1109/JDT.2012.2223452
Filename :
6363479
Link To Document :
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