• DocumentCode
    780851
  • Title

    IEEE Std 1149.1: where are we? where from here?

  • Author

    Tegethoff, Mick M V ; Parker, Kenneth P.

  • Author_Institution
    Manuf. Testing Div., Hewlett-Packard Co., Loveland, CO, USA
  • Volume
    12
  • Issue
    2
  • fYear
    1995
  • Firstpage
    53
  • Lastpage
    59
  • Abstract
    The authors discuss the status and celebrate the success of IEEE Std 1149.1, hoping to motivate discussion and action that will encourage further development of boundary scan-based testing. They offer the insight of experienced implementers of the standard working in competitive business environments
  • Keywords
    IEEE standards; boundary scan testing; logic testing; IEEE Std 1149.1; boundary scan-based testing; competitive business environments; Circuit simulation; Circuit testing; Electronic equipment testing; Logic testing; Manufacturing; Process design; Satellites; Software testing; System testing; Timing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.386006
  • Filename
    386006
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=780851