Title :
IEEE Std 1149.1: where are we? where from here?
Author :
Tegethoff, Mick M V ; Parker, Kenneth P.
Author_Institution :
Manuf. Testing Div., Hewlett-Packard Co., Loveland, CO, USA
Abstract :
The authors discuss the status and celebrate the success of IEEE Std 1149.1, hoping to motivate discussion and action that will encourage further development of boundary scan-based testing. They offer the insight of experienced implementers of the standard working in competitive business environments
Keywords :
IEEE standards; boundary scan testing; logic testing; IEEE Std 1149.1; boundary scan-based testing; competitive business environments; Circuit simulation; Circuit testing; Electronic equipment testing; Logic testing; Manufacturing; Process design; Satellites; Software testing; System testing; Timing;
Journal_Title :
Design & Test of Computers, IEEE
