Title :
Multifrequency analysis of faults in analog circuits
Author :
Slamani, Mustapha ; Kaminska, Bozena
Author_Institution :
Ecole Polytech. de Montreal, Que., Canada
Abstract :
Testability analysis of analog circuits in the presence of soft, large-deviation, and hard faults greatly facilitates production of testable systems. The authors analyze these faults by observing their symptoms at the circuit´s output, an approach that uses the same test methodology to analyze all three fault types. Their algorithm indicates the set of adequate test frequencies and nodes that increase fault observability. They conclude by generating test vectors for observing and covering these faults
Keywords :
analogue circuits; integrated circuit testing; analog circuits; fault observability; hard faults; multifrequency analysis of faults; test methodology; test vectors; testability analysis; testable systems; Analog circuits; Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Frequency; Observability; System testing;
Journal_Title :
Design & Test of Computers, IEEE
