Soft X-ray characterization of perpendicular recording media

Author

Fullerton, Eric E. ; Hellwig, Olav ; Ikeda, Yoshihiro ; Lengsfield, Byron ; Takano, Kentaro ; Kortright, Jeffery B.

Author_Institution

IBM Almaden Res. Center, San Jose, CA, USA

Volume

38

Issue

4

fYear

2002

fDate

7/1/2002 12:00:00 AM

Firstpage

1693

Lastpage

1697

Abstract

Various spectroscopy, imaging, and scattering techniques exploit core-level resonances accessible in the soft X-ray energies to obtain magnetic information in thin films with elemental specificity. In this paper, we describe the emerging technique of resonant soft X-ray small-angle scattering (SAS) as a probe of magnetic and chemical variations in recording media on the nanometer scale. In particular, we characterize the grain size of a CoB-Pd multilayer media and magnetic and chemical grain sizes in perpendicular CoPtCr media

Keywords

X-ray scattering; boron alloys; chromium alloys; cobalt alloys; core levels; grain size; magnetic multilayers; magnetic thin films; palladium; perpendicular magnetic recording; platinum alloys; CoB-Pd; CoB-Pd multilayer; CoPtCr; chemical structure; core level resonance; grain size; magnetic thin film; perpendicular recording medium; soft X-ray small-angle scattering; Chemicals; Grain size; Magnetic cores; Magnetic films; Magnetic resonance imaging; Optical imaging; Perpendicular magnetic recording; Spectroscopy; X-ray imaging; X-ray scattering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2002.1017758

Filename

1017758