DocumentCode :
781003
Title :
ZnO Thin-Film Transistor Ring Oscillators with 31-ns Propagation Delay
Author :
Sun, Jie ; Mourey, Devin A. ; Zhao, Dalong ; Park, Sung Kyu ; Nelson, Shelby F. ; Levy, David H. ; Freeman, Diane ; Cowdery-Corvan, Peter ; Tutt, Lee ; Jackson, Thomas N.
Author_Institution :
Dept. of Electr. Eng., Penn State Univ., University Park, PA
Volume :
29
Issue :
7
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
721
Lastpage :
723
Abstract :
We have fabricated ring oscillators (ROs) using ZnO thin films deposited by using a spatial atomic layer deposition process at atmospheric pressure and low temperature (200degC). Bottom-gate thin-film transistors with aluminum source and drain contacts were fabricated with a field-effect mobility of > 15 cm2/V ldr s. Seven-stage ROs operated at a frequency as high as 2.3 MHz for a supply voltage of 25 V, corresponding to a propagation delay of 31 ns/stage. These circuits also had propagation delays of ~100 ns/stage at a supply voltage of 15 V. To the best of our knowledge, these are the fastest ZnO circuits reported to date.
Keywords :
II-VI semiconductors; alumina; atomic layer deposition; carrier mobility; dielectric thin films; field effect integrated circuits; field effect transistor circuits; high-speed integrated circuits; nitrogen; radiofrequency integrated circuits; radiofrequency oscillators; semiconductor thin films; thin film circuits; thin film transistors; zinc compounds; ALD; Al2O3; TFT; ZnO:N; aluminum source; atmospheric pressure; drain contacts; fastest circuits; field-effect mobility; frequency 2.3 GHz; propagation delay; spatial atomic layer deposition process; temperature 200 C; thin-film transistor ring oscillators; voltage 15 V; voltage 25 V; zinc oxide thin film deposition; Aluminum; Atomic layer deposition; Circuits; Propagation delay; Ring oscillators; Sputtering; Temperature; Thin film transistors; Voltage; Zinc oxide; Ring oscillators (ROs); spatial atomic layer deposition (ALD); thin-film transistors (TFTs);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2008.923206
Filename :
4558116
Link To Document :
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