Title :
Novel NiGe MSM Photodetector Featuring Asymmetrical Schottky Barriers Using Sulfur Co-Implantation and Segregation
Author :
Ang, Kah-Wee ; Yu, Ming-Bin ; Zhu, Shi-Yang ; Chua, Khai-Tze ; Lo, Guo-Qiang ; Kwong, Dim-Lee
Author_Institution :
A*STAR, Inst. of Microelectron., Singapore
fDate :
7/1/2008 12:00:00 AM
Abstract :
We report the first demonstration of a novel germanium (Ge) metal-semiconductor-metal (MSM) photodetector featuring asymmetrical Schottky-barrier height for low dark current and high-speed photodetection applications. Through co-implantation and segregation of valence-mending adsorbate such as sulfur at the NiGe/Ge interface, the germanide Fermi level can be pinned close to the conduction band edge. This results in an effective modulation of hole Schottky-barrier height, leading to a significant dark current suppression by >3 orders of magnitude over a conventional MSM photodetector. When operated at a bias voltage VA of 1.0 V, a detector with an area of 804 mum2 shows a spectrum response of ~ 0.36 A/W or a corresponding quantum efficiency of ~ 34%. In addition, a frequency response measurement reveals the achievement of a -3-dB bandwidth of ~15 GHz at an illumination photon wavelength of 1550 nm.
Keywords :
Fermi level; Schottky barriers; germanium alloys; metal-semiconductor-metal structures; nickel alloys; photoconductivity; photodetectors; sulphur; NiGe MSM photodetector; NiGe-Ge; Schottky-barrier height; asymmetrical Schottky barriers; conduction band edge; dark current suppression; frequency response measurement; germanide Fermi level; germanium metal-semiconductor-metal photodetector; high-speed photodetection; quantum efficiency; sulfur co-implantation; sulfur segregation; valence-mending adsorbate; voltage 1.0 V; wavelength 1550 nm; Bandwidth; Dark current; Detectors; Frequency measurement; Frequency response; Germanium; Photodetectors; Schottky barriers; Voltage; Wavelength measurement; Ge-on-silicon-on-insulator (Ge-on-SOI); Schottky barrier; metal–semiconductor–metal (MSM) photodetectors; sulfur segregation;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2008.923541