DocumentCode :
781089
Title :
Novel Silicon-Controlled Rectifier (SCR) for High-Voltage Electrostatic Discharge (ESD) Applications
Author :
Liu, Zhiwei ; Liou, Juin J. ; Vinson, Jim
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL
Volume :
29
Issue :
7
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
753
Lastpage :
755
Abstract :
Electrostatic discharge (ESD) protection for high-voltage integrated circuits is challenging due to the requirement of high holding voltage to minimize the risk of ESD-induced latchup and electrical overstress. In this letter, a new silicon-controlled rectifier (SCR) is developed for this particular application. The SCR is designed based on the concept that the holding voltage can be increased by reducing the emitter injection efficiency in the SCR. This is accomplished by using a segmented emitter topology. Experimental data show that the new SCR can possess a holding voltage that is larger than 40 V and a failure current It2 that is higher than 28 mA/mum.
Keywords :
electrostatic discharge; power integrated circuits; thyristors; Si; emitter injection efficiency; failure current; high-voltage electrostatic discharge applications; high-voltage integrated circuits; segmented emitter topology; silicon-controlled rectifier; Application specific integrated circuits; Clamps; Computer science; Electrostatic discharge; Protection; Rectifiers; Resistors; Thyristors; Topology; Voltage; Electrostatic discharge (ESD); holding voltage; latchup immunity; transmission line pulsing (TLP);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2008.923711
Filename :
4558124
Link To Document :
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