DocumentCode :
78119
Title :
A 65-nm 25.1-ns 30.7-fJ Robust Subthreshold Level Shifter With Wide Conversion Range
Author :
Wenfeng Zhao ; Alvarez, Anastacia B. ; Yajun Ha
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Volume :
62
Issue :
7
fYear :
2015
fDate :
Jul-15
Firstpage :
671
Lastpage :
675
Abstract :
Level shifters (LS) are crucial interface circuits for multisupply voltage designs, and it is challenging to achieve both robust and efficient level conversion from subthreshold to aforementioned threshold. In this brief, we propose two circuit techniques for a novel subthreshold LS with wide conversion range. First, we introduce a novel LS circuit with NMOS-diode-based current limiter for current contention reduction to achieve robust and efficient level conversion. Second, we explore the inverse narrow width effect to increase the drivability of the pull-down devices for delay reduction. When implemented in a commercial 65-nm MTCMOS process, the proposed LS achieves robust conversion from deep subthreshold (sub-100 mV) to nominal supply voltage (1.2 V). For the target conversion from 0.3 to 1.2 V, the proposed LS shows on average 25.1-ns propagation delay, 30.7-fJ energy efficiency, and 2.5-nW leakage power across 25 test chips.
Keywords :
MOS integrated circuits; current limiters; integrated circuit design; integrated circuit measurement; power aware computing; NMOS-diode-based current limiter; current contention reduction; delay reduction; interface circuits; multisupply voltage designs; power 2.5 nW; robust subthreshold level shifter; size 65 nm; time 25.1 ns; voltage 1.2 V; wide conversion range; Circuits and systems; Current limiters; Delays; Robustness; Threshold voltage; Topology; Transistors; Inverse narrow width effect (INWE); Level Shifter (LS); MTCMOS; NMOS-diode current limiter; Sub-/near-threshold; level shifter (LS); sub-/near-threshold;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2015.2406354
Filename :
7047797
Link To Document :
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