Title :
A practical current sensing technique for I/sub DDQ/ testing
Author :
Tang, Jing-Jou ; Lee, Kuen-Jong ; Liu, Bin-Da
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
6/1/1995 12:00:00 AM
Abstract :
In this paper, a practical design for built-in current sensors (BICS´s) is proposed. This scheme can execute current testing during the normal circuit operation with very small impact on the performance of the circuit under test (CUT). In addition, scalable resolutions and no external voltage/current reference make this design more effective and efficient than previous designs. Moreover this scheme can be used to monitor the current-related faults of both CMOS and non-CMOS circuits. Thus it is highly suitable for design for testability (DFT) on a multiple-chip module (MCM) or to be the current monitor on the test fixture under the quality test action group (QTAG) standard.<>
Keywords :
automatic testing; built-in self test; design for testability; digital integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing; monitoring; monolithic integrated circuits; multichip modules; CMOS circuits; DFT; I/sub DDQ/ testing; MCM; QTAG standard; built-in current sensors; current monitor; current sensing technique; current-related fault monitoring; design for testability; multiple-chip module; nonCMOS circuits; quality test action group; test fixture; CMOS logic circuits; Circuit faults; Circuit testing; Degradation; Design for testability; Fixtures; Logic testing; Monitoring; Semiconductor device modeling; Voltage;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
