• DocumentCode
    781685
  • Title

    Embedded software-based self-test for programmable core-based designs

  • Author

    Krstic, Angela ; Lai, Wei-Cheng ; Cheng, Kwang-Ting ; Chen, Li ; Dey, Sujit

  • Author_Institution
    California Univ., Santa Barbara, CA, USA
  • Volume
    19
  • Issue
    4
  • fYear
    2002
  • Firstpage
    18
  • Lastpage
    27
  • Abstract
    The programmable cores on SoCs can perform on-chip test generation, measurement, response analysis, and even diagnosis. This software-based approach to self-testing enables at-speed testing and incurs low DFT overhead. We give an overview of the existing embedded software-based self-testing and self-diagnosis methods for core-based SoC designs, and we discuss the challenges to further developing this new testing paradigm
  • Keywords
    built-in self test; embedded systems; integrated circuit testing; logic testing; microprocessor chips; DFT overhead; core-based SoC designs; embedded software-based self-test; measurement; microprocessors; on-chip test generation; programmable core-based designs; response analysis; self-diagnosis methods; system-on-a-chip architectures; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Logic testing; Microprocessors; Software testing; System testing; System-on-a-chip;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2002.1018130
  • Filename
    1018130
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=781685