Title :
An Innovative Ellipsoidal Layout Style to Further Boost the Electrical Performance of MOSFETs
Author :
Gimenez, Salvador P. ; Correia, Marcello M. ; Neto, Enrico D. ; Silva, Cristina R.
Author_Institution :
Dept. of Electr. Eng., FEI Univ. Center, São Bernardo do Campo, Brazil
Abstract :
This letter describes the impact of using a new gate geometry (ellipsoidal) rather than the standard one (rectangular) to implement planar metal-oxide-semiconductor field-effect transistors (MOSFETs). Our experimental results have been carried out using a 350-nm bulk complementary MOS technology node. We show that the proposed layout has been capable of increasing the ON-state and saturation drain currents in 2 and 3.2 times, respectively. In addition, the ellipsoidal MOSFET has been able to reduce the delay time constant by 61%. Therefore, we believe this new layout can be used as an alternative way to implement MOSFETs, boosting their analog electrical performance with an appropriate layout changing.
Keywords :
MOSFET; semiconductor device models; MOSFET; bulk complementary MOS technology node; electrical performance; ellipsoidal layout; gate geometry; metal-oxide-semiconductor field-effect transistors; saturation drain currents; Diamonds; Geometry; Layout; Logic gates; MOSFET; Performance evaluation; Shape; Ellipsoidal layout style; LCE and PAMDLE; MOSFET;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2015.2437716