Title :
Guest editors´ introduction: Speed test and speed binning for complex ICs
Author :
Butler, K.M. ; Kwang-Ting Cheng ; Wang, L.-C.
Author_Institution :
Texas Instruments
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Automatic testing; Computer science; Debugging; Delay; Electrical engineering; Frequency modulation; Instruments; Logic testing; Test pattern generators; Timing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1232250
