• DocumentCode
    782167
  • Title

    An on-chip self-repair calculation and fusing methodology

  • Author

    Anand, Darren ; Cowan, Bruce ; Farnsworth, Owen ; Jakobsen, Peter ; Oakland, Steve ; Ouellette, Michael R. ; Wheater, Donald L.

  • Volume
    20
  • Issue
    5
  • fYear
    2003
  • Firstpage
    67
  • Lastpage
    75
  • Abstract
    Laser fusing is a standard technique for improving yield with memory reconfiguration and repair, but implementing fusing in production can be challenging and costly. This article introduces an electrically programmable polysilicon fuse and shows how it can reduce fuse area and programming complexity.
  • Keywords
    built-in self test; integrated circuit yield; BIST; electrically programmable polysilicon fuse; fuse area; fusing methodology; laser fusing; memory reconfiguration; on-chip self-repair calculation; production; programming complexity; yield; Built-in self-test; Engines; FETs; Functional programming; Fuses; Logic programming; Master-slave; Multiplexing; Production; Testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1232258
  • Filename
    1232258