DocumentCode
782167
Title
An on-chip self-repair calculation and fusing methodology
Author
Anand, Darren ; Cowan, Bruce ; Farnsworth, Owen ; Jakobsen, Peter ; Oakland, Steve ; Ouellette, Michael R. ; Wheater, Donald L.
Volume
20
Issue
5
fYear
2003
Firstpage
67
Lastpage
75
Abstract
Laser fusing is a standard technique for improving yield with memory reconfiguration and repair, but implementing fusing in production can be challenging and costly. This article introduces an electrically programmable polysilicon fuse and shows how it can reduce fuse area and programming complexity.
Keywords
built-in self test; integrated circuit yield; BIST; electrically programmable polysilicon fuse; fuse area; fusing methodology; laser fusing; memory reconfiguration; on-chip self-repair calculation; production; programming complexity; yield; Built-in self-test; Engines; FETs; Functional programming; Fuses; Logic programming; Master-slave; Multiplexing; Production; Testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2003.1232258
Filename
1232258
Link To Document