DocumentCode :
782167
Title :
An on-chip self-repair calculation and fusing methodology
Author :
Anand, Darren ; Cowan, Bruce ; Farnsworth, Owen ; Jakobsen, Peter ; Oakland, Steve ; Ouellette, Michael R. ; Wheater, Donald L.
Volume :
20
Issue :
5
fYear :
2003
Firstpage :
67
Lastpage :
75
Abstract :
Laser fusing is a standard technique for improving yield with memory reconfiguration and repair, but implementing fusing in production can be challenging and costly. This article introduces an electrically programmable polysilicon fuse and shows how it can reduce fuse area and programming complexity.
Keywords :
built-in self test; integrated circuit yield; BIST; electrically programmable polysilicon fuse; fuse area; fusing methodology; laser fusing; memory reconfiguration; on-chip self-repair calculation; production; programming complexity; yield; Built-in self-test; Engines; FETs; Functional programming; Fuses; Logic programming; Master-slave; Multiplexing; Production; Testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2003.1232258
Filename :
1232258
Link To Document :
بازگشت