• DocumentCode
    782207
  • Title

    Space-Radiation Effects in Integrated Circuits

  • Author

    Hamman, Donald J.

  • Author_Institution
    Battelle Memorial Institute Columbus, Ohio
  • Volume
    13
  • Issue
    6
  • fYear
    1966
  • Firstpage
    160
  • Lastpage
    167
  • Keywords
    Circuits; Conductivity; Crystallization; Degradation; Electrons; Lattices; Life estimation; Microelectronics; Protons; Surface contamination;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1996.4324357
  • Filename
    4324357