• DocumentCode
    782529
  • Title

    Acoustic microscopy and dispersion of leaky Rayleigh waves on randomly rough surfaces: a theoretical study

  • Author

    Pecorari, Claudio ; Briggs, G.Andrew D.

  • Author_Institution
    Dept. of Mater., Oxford Univ., UK
  • Volume
    43
  • Issue
    3
  • fYear
    1996
  • fDate
    5/1/1996 12:00:00 AM
  • Firstpage
    428
  • Lastpage
    433
  • Abstract
    A theoretical investigation of the dispersion of leaky Rayleigh waves propagating along one-dimensional (1-D) rough fluid-solid interfaces was carried out by simulating the measurement process of a line-focus beam acoustic microscope. The interface profiles were described in terms of their rms, also known as the roughness of the profile, autocorrelation length, and autocorrelation function. The reflectivity of the interfaces was calculated by using a second-order perturbation approach in the profile roughness. Theoretical V(z) curves were generated and analyzed to yield values of the phase velocity of the Rayleigh waves. The dependence of the Rayleigh wave velocity on the profile and material parameters was examined. Significant variations of the phase velocity were found for values of the roughness which are small compared to the shortest of the wavelengths involved in the scattering. The dispersion relations also showed considerable sensitivity to changes in mechanical properties typical of materials of engineering interest. In the low-frequency range, simulations indicated the dispersion of Rayleigh waves to be rather insensitive to the spectral content of the profile.
  • Keywords
    Rayleigh waves; acoustic dispersion; acoustic focusing; acoustic microscopy; acoustic wave reflection; acoustic wave velocity; perturbation techniques; surface acoustic waves; surface topography; 1-D rough fluid-solid interfaces; acoustic microscopy; autocorrelation function; autocorrelation length; dispersion; interface profiles; leaky Rayleigh waves; line-focus beam acoustic microscope; low-frequency range; phase velocity; profile roughness; randomly rough surfaces; reflectivity; second-order perturbation approach; simulations; Acoustic beams; Acoustic measurements; Acoustic propagation; Acoustic scattering; Acoustic waves; Autocorrelation; Dispersion; Microscopy; Phase change materials; Reflectivity;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.489401
  • Filename
    489401