DocumentCode :
782566
Title :
Transient modeling of ferroelectric capacitors for nonvolatile memories
Author :
Sheikholeslami, Ali ; Gulak, P. Glenn
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Volume :
43
Issue :
3
fYear :
1996
fDate :
5/1/1996 12:00:00 AM
Firstpage :
450
Lastpage :
456
Abstract :
Present ferroelectric (FE) capacitor models mostly rely on continuous hysteresis loop characteristics of FE materials. Our experimental results show that this approach overestimates the remanent and saturation polarizations available for nonvolatile semiconductor memories by more than 50%. A behavioral transient model based on pulse measurement results is proposed and implemented as an HSPICE macro-model. The model mainly consists of two nonlinear capacitors, corresponding to the two different polarization states of an FE capacitor.
Keywords :
SPICE; capacitors; dielectric hysteresis; dielectric polarisation; ferroelectric capacitors; ferroelectric storage; integrated memory circuits; modelling; random-access storage; transient analysis; HSPICE macro-model; behavioral transient model; capacitor models; ferroelectric capacitors; hysteresis loop characteristics; nonlinear capacitors; nonvolatile memories; nonvolatile semiconductor memories; pulse measurement results; remanent polarization; saturation polarization; transient modeling; Capacitors; Circuit simulation; Ferroelectric materials; Iron; Nonvolatile memory; Piecewise linear approximation; Piecewise linear techniques; Polarization; Voltage; Writing;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.489404
Filename :
489404
Link To Document :
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